The vacuum measurement chamber of devices in the XUV® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. This instrument is ideal for very demanding coating thickness measurement and material analysis tasks.

Features:
• Particularly suitable for research and development with their low detection limits, repeatable precision and universally upgradable measurement possibilities
• Vacuum chamber and high-performance silicon drift detector for precise measurement, even of light elements
• Automated serial testing with programmable X-, Y- and Z-axes
• Adaptable to the demands of various materials and measurement conditions by means of exchangeable apertures and filters

Applications:
• Coating Thickness Measurement
• Layers of light elements from sodium onwards on the nm scale
• Aluminum and silicon layers

Material Analysis
• Determination of the authenticity and provenance of precious stones
• General material analysis and forensics
• High-resolution trace analysis